Laser-induced breakdown spectroscopy in industrial and security applications

Journal Article · Sat May 01 00:00:00 EDT 2010 · Applied Optics

DOI:https://doi.org/10.1364/AO.49.00C132· OSTI ID:22036467

Bol'shakov, Alexander A; Yoo, Jong H; Chunyi, Liu; Plumer, John R; Russo, Richard E

Laser-induced breakdown spectroscopy (LIBS) offers rapid, localized chemical analysis of solid or liquid materials with high spatial resolution in lateral and depth profiling, without the need for sample preparation. Principal component analysis and partial least squares algorithms were applied to identify a variety of complex organic and inorganic samples. This work illustrates how LIBS analyzers can answer a multitude of real-world needs for rapid analysis, such as determination of lead in paint and children's toys, analysis of electronic and solder materials, quality control of fiberglass panels, discrimination of coffee beans from different vendors, and identification of generic versus brand-name drugs. Lateral and depth profiling was performed on children's toys and paint layers. Traditional one-element calibration or multivariate chemometric procedures were applied for elemental quantification, from single laser shot determination of metal traces at {approx}10 {mu}g/g to determination of halogens at 90 {mu}g/g using 50-shot spectral accumulation. The effectiveness of LIBS for security applications was demonstrated in the field by testing the 50-m standoff LIBS rasterizing detector.

• OSTI ID: 22036467
• Journal Information: Applied Optics, Journal Name: Applied Optics Journal Issue: 13 Vol. 49; ISSN 0003-6935; ISSN APOPAI
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
74 ATOMIC AND MOLECULAR PHYSICS
ALGORITHMS
BREAKDOWN
CALIBRATION
CHEMICAL ANALYSIS
COFFEE BEANS
FIBERGLASS
HALOGENS
LASER RADIATION
LAYERS
LEAST SQUARE FIT
MULTIVARIATE ANALYSIS
QUALITY CONTROL
SAMPLE PREPARATION
SOLIDS
SPATIAL RESOLUTION
SPECTROSCOPY