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Title: {mu} {yields} e{gamma} decay versus the {mu} {yields} eee bound and lepton flavor violating processes in supernova

Journal Article · · Journal of Experimental and Theoretical Physics
 [1]
  1. Institute for Theoretical and Experimental Physics (Russian Federation)

Even tiny lepton flavor violation (LFV) due to some New Physics is able to alter the conditions inside a collapsing supernova core and probably to facilitate the explosion. LFV emerges naturally in a see-saw type-II model of neutrino mass generation. Experimentally, the LFV beyond the Standard Model is constrained by rare lepton decay searches. In particular, strong bounds are imposed on the {mu} {yields} eee branching ratio and on the {mu}-e conversion in muonic gold. Currently, the {mu}{yields}e{gamma} is under investigation in the MEG experiment that aims at a dramatic increase in sensitivity in the next three years. We seek a see-saw type-II LFV pattern that fits all the experimental constraints, leads to Br({mu} {yields}e{gamma}) Greater-Than-Or-Equivalent-To Br({mu}{mu} {yields}eee), and ensures a rate of LFV processes in supernova high enough to modify the supernova physics. These requirements are sufficient to eliminate almost all freedom in the model. In particular, they lead to the prediction 0.4 Multiplication-Sign 10{sup -12} Less-Than-Or-Equivalent-To Br({mu} {yields} e{gamma}) Less-Than-Or-Equivalent-To 6 Multiplication-Sign 10{sup -12}, which will be testable by MEG in the nearest future. The considered scenario also constrains the neutrino mass-mixing pattern and provides lower and upper bounds on {tau}-lepton LFV decays. We also briefly discuss a model with a single bilepton in which the {mu} {yields} eee decay is absent at the tree level.

OSTI ID:
22027907
Journal Information:
Journal of Experimental and Theoretical Physics, Vol. 114, Issue 3; Other Information: Copyright (c) 2012 Pleiades Publishing, Ltd.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7761
Country of Publication:
United States
Language:
English