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Title: Luminescence properties of core-shell structured SiO{sub 2}-CaMoO{sub 4}:Eu{sup 3+} phosphor

Journal Article · · Journal of Solid State Chemistry
 [1];  [1]; ;  [2];  [1]
  1. College of Chemistry and Chemical Engineering, Chongqing University, Chongqing 400044 (China)
  2. Key Laboratory for Optoelectronic Technology and Systems, Ministry of Education, College of Optoelectronic Engineering, Chongqing University, Chongqing 400044 (China)

Uniform SiO{sub 2}-CaMoO{sub 4}:Eu{sup 3+} red phosphor has been synthesized by sol-gel method, and its luminescence properties have been studied by fluorescence spectrometer. The structure and morphology of the SiO{sub 2}-CaMoO{sub 4}:Eu{sup 3+} red phosphor have been investigated by transmission electron microscopy (TEM), scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS), X-ray diffraction (XRD), and FT-IR spectrometer. Results indicate that phosphor particles have a core-shell structure and the thickness of the SiO{sub 2}-shell is about 60 nm. In addition, the luminescent intensity of SiO{sub 2}-CaMoO{sub 4}:Eu{sup 3+} red phosphor has been greatly enhanced with respect to CaMoO{sub 4}:Eu{sup 3+} phosphor. But the lifetime {tau} value of SiO{sub 2}-coated CaMoO{sub 4}:Eu{sup 3+} is slightly smaller than that of non-coated CaMoO{sub 4}:Eu{sup 3+}. - Graphical abstract: A SiO{sub 2} nano-layer with thickness of 60 nm and good uniformity was successfully coated on the surface of CaMoO{sub 4}:Eu{sup 3+} phosphor. This coating greatly increases luminescent intensity of the phosphor. Highlights: Black-Right-Pointing-Pointer SiO{sub 2}-CaMoO{sub 4}:Eu{sup 3+} was successfully synthesized by sol-gel method. Black-Right-Pointing-Pointer The SiO{sub 2} nano-layer increases luminescent intensity of the phosphor. Black-Right-Pointing-Pointer The SiO{sub 2} nano-layer reduces fluorescence lifetime of the phosphor.

OSTI ID:
22012047
Journal Information:
Journal of Solid State Chemistry, Vol. . 187; Other Information: Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
Country of Publication:
United States
Language:
English