Multiple-Wave Diffraction in High Energy Resolution Back-Reflecting X-Ray Optics
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973 (United States)
We have studied the effects of multiple-wave diffraction in a novel optical scheme recently published by Shvyd'ko et al. utilizing Bragg diffraction of x rays in backscattering geometry from asymmetrically cut crystals for achieving energy resolutions beyond the intrinsic width of the Bragg reflection. By numerical simulations based on dynamic x-ray diffraction and by experimentation involving two-dimensional angular scans of the back-reflecting crystal, multiple-wave diffraction was found to contribute up to several tens percent loss of efficiency but can be avoided without degrading the energy resolution of the original scheme by careful choice of azimuthal orientation of the diffracting crystal surface and by tilting of the crystal perpendicular to the dispersion plane.
- OSTI ID:
- 21612157
- Journal Information:
- Physical Review Letters, Vol. 107, Issue 15; Other Information: DOI: 10.1103/PhysRevLett.107.155503; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
- Country of Publication:
- United States
- Language:
- English
The Ultrahigh Resolution IXS Beamline of NSLS-II: Recent Advances and Scientific Opportunities
|
journal | March 2013 |
High-contrast sub-millivolt inelastic X-ray scattering for nano- and mesoscale science
|
journal | June 2014 |
Similar Records
X-Ray Bragg Diffraction in Asymmetric Backscattering Geometry
Multiple-beam Bragg diffraction in backscattering: The four-beam case