Structural, Morphological and Optical properties of Sputtered Nickel oxide Thin Films
- Department of Physics, Sri Venkateswara University, Tirupati-517 502 (India)
Nickel oxide (NiO) thin films have been deposited by dc reactive magnetron sputtering technique on glass substrates at various substrate temperatures in the range of 303 to 723 K. The influence of substrate temperature on structural, morphological, compositional and optical properties was analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive spectroscopy (EDS) and spectrophotometer studies. The structural properties of the films were strongly influenced by the substrate temperature. From the microstructural studies, fine and uniform grains were grown with RMS roughness of 9.4 nm at substrate temperature of 523 K. The optical results indicated that the optical transmittance of the films increases with increasing substrate temperature up to 523 K, thereafter decreases. The optical band of the films increases with substrate temperature initially, thereafter decreased at higher temperatures. The Highest optical transmittance of 60 % and optical band gap of 3.82 eV was observed in the present study.
- OSTI ID:
- 21612030
- Journal Information:
- AIP Conference Proceedings, Vol. 1391, Issue 1; Conference: OPTICS 2011: International conference on light - Optics: phenomena, materials, devices, and characterization, Calicut, Kerala (India), 23-25 May 2011; Other Information: DOI: 10.1063/1.3646785; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
ABSORPTION SPECTROSCOPY
ATOMIC FORCE MICROSCOPY
ENERGY GAP
GLASS
MICROSTRUCTURE
MORPHOLOGY
NICKEL OXIDES
OPACITY
ROUGHNESS
SCANNING ELECTRON MICROSCOPY
SPUTTERING
SUBSTRATES
TEMPERATURE DEPENDENCE
THIN FILMS
X-RAY DIFFRACTION
CHALCOGENIDES
COHERENT SCATTERING
DIFFRACTION
ELECTRON MICROSCOPY
FILMS
MICROSCOPY
NICKEL COMPOUNDS
OPTICAL PROPERTIES
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SCATTERING
SPECTROSCOPY
SURFACE PROPERTIES
TRANSITION ELEMENT COMPOUNDS