Huge Anisotropic Magnetoresistance In Epitaxial Sm{sub 0.53}Sr{sub 0.47}MnO{sub 3} Thin Films

Journal Article · Fri Jul 15 04:00:00 EDT 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3606052· OSTI ID:21608186

Srivastava, M K ^[1]; Kaur, A ^[2]; Singh, H K ^[1]

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1. National Physical Laboratory (CSIR), Dr. K. S. Krishnan Marg, New Delhi-110012 (India)
2. Department of Physics and Astrophysics, University of Delhi, Delhi-110007 (India)

In the present work we have studied the variation of LFMR as a function of the angle ({theta}) between the applied magnetic field and the plane of the film. DC magnetron sputtering was used for film preparation on LSAT single crystal substrates from Sm{sub 0.55}Sr{sub 0.45}MnO{sub 3} targets synthesized by the solid state reaction route. X-ray diffraction confirmed the epitaxial nature of these films. These films have simultaneous ferromagnetic and metal insulator transition at {approx}91 K. These films exhibit enhanced low field colossal magnetoresistance {approx}99% at 3.6 kOe at 80 K. Huge anisotropy is observed in the MR, which decreases from {approx}80% to 6% as {theta} increases from 0 to 90 deg. The evolution of the resistance as a function of time and the magnetic field at a constant temperature (T{approx_equal}77 K) has also been studied.

• OSTI ID: 21608186
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1349; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METAL COMPOUNDS
ANISOTROPY
COHERENT SCATTERING
CRYSTAL GROWTH METHODS
CRYSTALS
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
EPITAXY
FILMS
MAGNETIC FIELDS
MAGNETORESISTANCE
MANGANATES
MANGANESE COMPOUNDS
MONOCRYSTALS
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
RARE EARTH COMPOUNDS
SAMARIUM COMPOUNDS
SCATTERING
SOLIDS
SPUTTERING
STRONTIUM COMPOUNDS
SUBSTRATES
TEMPERATURE DEPENDENCE
THIN FILMS
TIME DEPENDENCE
TRANSITION ELEMENT COMPOUNDS
VARIATIONS
X-RAY DIFFRACTION