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Title: Desorption of Ag from Grain Boundaries in Ag Film on Br and H-Passivated Si(111) Surfaces

Abstract

Growth of Ag film on Br- and H-passivated Si(111) surfaces was examined by Rutherford backscattering spectrometry (RBS), scanning electron microscopy (SEM) and photoemission electron microscopy (PEEM) techniques. The phenomenon of thermal grooving was observed after annealing at higher temperatures. Hierarchical desorption of Ag from the grain boundaries produce a fractal structure of Ag-depleted regions. Hierarchical desorption may be used for nanopatterning of the layer.

Authors:
; ; ;  [1];  [2]
  1. Department of Materials Science, Indian Association for the Cultivation of Science, Jadavpur, Kolkata 700032 (India)
  2. Materials Science Division, Indira Gandhi Center for Atomic Research, Kalapakkam 603102 (India)
Publication Date:
OSTI Identifier:
21608184
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1349; Journal Issue: 1; Conference: 55. DAE solid state physics symposium 2010, Manipal (India), 26-30 Dec 2010; Other Information: DOI: 10.1063/1.3606046; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 36 MATERIALS SCIENCE; ANNEALING; CRYSTAL GROWTH; DESORPTION; EMISSION SPECTROSCOPY; FRACTALS; GRAIN BOUNDARIES; LAYERS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON; SILVER; SURFACES; THIN FILMS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; FILMS; HEAT TREATMENTS; METALS; MICROSCOPY; MICROSTRUCTURE; SECONDARY EMISSION; SEMIMETALS; SORPTION; SPECTROSCOPY; TRANSITION ELEMENTS

Citation Formats

Roy, Anupam, Batabyal, R., Mahato, J. C., Dev, B. N., and Sundaravel, B.. Desorption of Ag from Grain Boundaries in Ag Film on Br and H-Passivated Si(111) Surfaces. United States: N. p., 2011. Web. doi:10.1063/1.3606046.
Roy, Anupam, Batabyal, R., Mahato, J. C., Dev, B. N., & Sundaravel, B.. Desorption of Ag from Grain Boundaries in Ag Film on Br and H-Passivated Si(111) Surfaces. United States. doi:10.1063/1.3606046.
Roy, Anupam, Batabyal, R., Mahato, J. C., Dev, B. N., and Sundaravel, B.. Fri . "Desorption of Ag from Grain Boundaries in Ag Film on Br and H-Passivated Si(111) Surfaces". United States. doi:10.1063/1.3606046.
@article{osti_21608184,
title = {Desorption of Ag from Grain Boundaries in Ag Film on Br and H-Passivated Si(111) Surfaces},
author = {Roy, Anupam and Batabyal, R. and Mahato, J. C. and Dev, B. N. and Sundaravel, B.},
abstractNote = {Growth of Ag film on Br- and H-passivated Si(111) surfaces was examined by Rutherford backscattering spectrometry (RBS), scanning electron microscopy (SEM) and photoemission electron microscopy (PEEM) techniques. The phenomenon of thermal grooving was observed after annealing at higher temperatures. Hierarchical desorption of Ag from the grain boundaries produce a fractal structure of Ag-depleted regions. Hierarchical desorption may be used for nanopatterning of the layer.},
doi = {10.1063/1.3606046},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1349,
place = {United States},
year = {2011},
month = {7}
}