Desorption of Ag from Grain Boundaries in Ag Film on Br and H-Passivated Si(111) Surfaces

Journal Article · Fri Jul 15 00:00:00 EDT 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3606046· OSTI ID:21608184

Roy, Anupam; Batabyal, R; Mahato, J C; Dev, B N ^[1]; Sundaravel, B ^[2]

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1. Department of Materials Science, Indian Association for the Cultivation of Science, Jadavpur, Kolkata 700032 (India)
2. Materials Science Division, Indira Gandhi Center for Atomic Research, Kalapakkam 603102 (India)

Growth of Ag film on Br- and H-passivated Si(111) surfaces was examined by Rutherford backscattering spectrometry (RBS), scanning electron microscopy (SEM) and photoemission electron microscopy (PEEM) techniques. The phenomenon of thermal grooving was observed after annealing at higher temperatures. Hierarchical desorption of Ag from the grain boundaries produce a fractal structure of Ag-depleted regions. Hierarchical desorption may be used for nanopatterning of the layer.

• OSTI ID: 21608184
• Journal Information: AIP Conference Proceedings, Vol. 1349, Issue 1; Conference: 55. DAE solid state physics symposium 2010, Manipal (India), 26-30 Dec 2010; Other Information: DOI: 10.1063/1.3606046; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
ANNEALING
CRYSTAL GROWTH
DESORPTION
EMISSION SPECTROSCOPY
FRACTALS
GRAIN BOUNDARIES
LAYERS
PHOTOELECTRON SPECTROSCOPY
PHOTOEMISSION
RUTHERFORD BACKSCATTERING SPECTROSCOPY
SCANNING ELECTRON MICROSCOPY
SILICON
SILVER
SURFACES
THIN FILMS
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
FILMS
HEAT TREATMENTS
METALS
MICROSCOPY
MICROSTRUCTURE
SECONDARY EMISSION
SEMIMETALS
SORPTION
SPECTROSCOPY
TRANSITION ELEMENTS