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Title: Structural and magnetic properties of La{sub 0.7}Sr{sub 0.3}MnO{sub 3} thin films integrated onto Si(100) substrates with SrTiO{sub 3} as buffer layer

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3565422· OSTI ID:21560121
; ;  [1]; ;  [2];  [3]
  1. LSPM, UPR 3407 CNRS, Universite Paris 13, Av. J.-B. Clement, 93430 Villetaneuse (France)
  2. Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853-1501 (United States)
  3. LPEM, UPR A0005 CNRS, ESPCI, 10 Rue Vauquelin, F-75231 Paris cedex 5 (France)

La{sub 0.7}Sr{sub 0.3}MnO{sub 3} (LSMO) thin films with a thickness d of 10, 20, 60, and 100 nm were grown on 20-nm-thick SrTiO{sub 3}-buffered (100) silicon substrates by a reactive molecular beam epitaxy. For all samples, x-ray diffraction (XRD) revealed an excellent epitaxy with in-plane cubic [100] and [010] axes of LSMO. The XRD measured values of the out-of-plane lattice parameter suggest that the strain state does not vary significantly from sample to sample. A super conducting quantum interference device reveals that the room temperature magnetization at saturation increases with d and nearly reaches the bulk value for d = 100 nm; the Curie temperature ranges in the 320-350 K interval, to compare to 360 K in the bulk. Ferromagnetic resonance (FMR) in cavity (at 9.5 GHz) and microstrip FMR used to investigate the dynamic magnetic properties, revealed a fourfold anisotropy showing its easy axes along the [110] and [110] directions. In the thickest samples (d > 20 nm), the FMR spectra present two distinct resonant modes. This splitting is presumably due to the simultaneous presence of two different magnetic phases.

OSTI ID:
21560121
Journal Information:
Journal of Applied Physics, Vol. 109, Issue 7; Conference: 55. annual conference on magnetism and magnetic materials, Atlanta, GA (United States), 14-18 Nov 2010; Other Information: DOI: 10.1063/1.3565422; (c) 2011 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English