Perpendicular magnetic anisotropy and spin reorientation transition in L1{sub 0} FePt films

Journal Article · Fri Apr 01 04:00:00 EDT 2011 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3562506· OSTI ID:21560111

Ahn, Jae Young; Lee, Nyun Jong; Kim, Tae Hee ^[1]; Lee, J -H ^[2]; Michel, Anny; Eyidi, Dominique ^[3]

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1. Department of Physics, Ewha Womans University, Seoul 120-750 (Korea, Republic of)
2. Partron Co., LTD., Hwaseong-si, Gyeonggi-do 445-170 (Korea, Republic of)
3. Departement de Physique et Mecanique des Materiaux, Institut Pprime, UPR 3346, CNRS-Universite de Poitiers-ENSMA, SP2MI-Teleport 2, F86962 Futuroscope-Chasseneuil cedex (France)

We investigated the thickness and composition dependence of perpendicular magnetic anisotropy (PMA) in L1{sub 0} Fe{sub 1-x}Pt{sub x} (x = 0.4, 0.5, and 0.55) films. The FePt films with different thicknesses of 35 and 70 A were grown at the substrate temperature T{sub s} = 300 deg. C by molecular beam epitaxy coevaporation technique. A (001)-oriented epitaxial L1{sub 0} FePt film was grown on the thin (001)-oriented fcc Pt layer, while a poorly crystallized FePt film was formed on the (111)-textured Pt layer. Our results showed that, at a fixed thickness of 70 A, the PMA of FePt alloy films is enhanced as Pt content increases from 40% to 55%.

• OSTI ID: 21560111
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 7 Vol. 109; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALLOYS
ANGULAR MOMENTUM
ANISOTROPY
COHERENT SCATTERING
CRYSTAL GROWTH METHODS
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CUBIC LATTICES
DIFFRACTION
DIMENSIONS
ELECTRON MICROSCOPY
EPITAXY
FCC LATTICES
FILMS
IRON ALLOYS
LAYERS
MAGNETIC PROPERTIES
MICROSCOPY
MOLECULAR BEAM EPITAXY
PARTICLE PROPERTIES
PHYSICAL PROPERTIES
PLATINUM ALLOYS
PLATINUM METAL ALLOYS
RINGS
SCATTERING
SPIN
SUBSTRATES
THICKNESS
TRANSITION ELEMENT ALLOYS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION