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Effects of CrRu-SiO{sub x} underlayer with MgO intermediate layer on the microstructure and magnetic properties of FePt-C thin film

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3564946· OSTI ID:21538252
 [1];  [2];  [3]; ;  [1]
  1. Department of Materials Science and Engineering, National University of Singapore, Singapore 117576 (Singapore)
  2. Data Storage Institute, Agency for Science, Technology and Research (A-STAR), Singapore 117608 (Singapore)
  3. Seagate Technology, Fremont, California 94538 (United States)
The effect of the CrRu-SiO{sub x} underlayer with different doping concentrations and the thickness of the CrRu underlayer on the microstructure and magnetic properties of FePt-C films were investigated. FePt films exhibited L1{sub 0} (001) texture at various SiO{sub x} doping concentrations. The coercivities were as large as 28 kOe and the slope of M-H loop at coercivity was approximately equal to 1, suggesting that FePt grains were well exchange decoupled. Grain size was only slightly reduced after introducing the CrRu-SiO{sub x} underlayer. But the contact angle between the FePt grains and the MgO intermediate layer around 135 deg. indicated the a MgO intermediate layer was not favored for smaller grains to obtain good L1{sub 0} (001) texture. X-ray photoelectron spectroscopy in-depth profile showed that Si diffused into a whole FePt-C layer and C diffused to the film surface.
OSTI ID:
21538252
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 7 Vol. 109; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English