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Switching surface polarization of atomic force microscopy probe utilizing photoisomerization of photochromic molecules

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3552926· OSTI ID:21538178
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  1. Department of Applied Physics, Graduate School of Engineering, Osaka University 2-1 Yamada-oka, Suita, Osaka 565-0871 (Japan)
An attempt to develop an atomic force microscopy (AFM) probe with optically switchable polarization is described. Modification with a single molecular layer of photochromic molecules was attempted onto a Si substrate that is a prototype for a probe surface. Polarization switching caused by alternate irradiation of UV and visible lights were detected using the electrostatic force?>spectroscopy (EFS) technique. Si substrates modified with spiropyran and azobenzene exhibited reversible polarization switching that caused changes in CPD of about 100 and 50 mV, respectively. Modification with spiropyran was also attempted onto a Si probe and resulted in a CPD change of about 100 mV. It was confirmed that modification of an AFM probe or substrate with a single molecular layer of photochromic molecules can generate surface polarization switching of a mechanically detectable level.
OSTI ID:
21538178
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 6 Vol. 109; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English