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Title: Epitaxial growth and piezoelectric characterization of the (1-x)BiScO{sub 3}-(x)PbTiO{sub 3} ultrathin film

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3567297· OSTI ID:21538175
; ; ; ;  [1]
  1. Department of Physics, Pusan National University, Busan 609-735 (Korea, Republic of)

We studied ferroelectric properties of morphotropic phase boundary (1-x)BiScO{sub 3}-(x)PbTiO{sub 3} (BSPT, x = 0.64) epitaxial thin films on SrTiO{sub 3} (001) and Nb:SrTiO{sub 3} (001). BSPT thin films with various thicknesses were deposited using off-axis radio frequency magnetron sputtering. By analyzing x-ray data of BSPT thin films with various thicknesses, we confirmed that films thinner than {approx}22 nm were in a strained state. Films thicker than {approx}22 nm were in a relaxed state because of the strain relaxation mechanism caused by misfit dislocation formation. Clear piezoresponses and polarization reversal phenomena can be observed in the ultrathin limit down to 8 nm through Piezo Force Microscope experiments. The piezoresponse data as a function of thickness correlates with the structural modification of thin films.

OSTI ID:
21538175
Journal Information:
Journal of Applied Physics, Vol. 109, Issue 6; Other Information: DOI: 10.1063/1.3567297; (c) 2011 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English