Single-shot carrier-envelope-phase-tagged ion-momentum imaging of nonsequential double ionization of argon in intense 4-fs laser fields
- Max-Planck-Institut fuer Quantenoptik, D-85748 Garching (Germany) and J. R. Macdonald Laboratory, Department of Physics, Kansas State University, Manhattan, Kansas 66506 (United States)
Single-shot carrier-envelope-phase (CEP) tagging is combined with a reaction mircoscope (REMI) to investigate CEP-dependent processes in atoms. Excellent experimental stability and data acquisition longevity are achieved. Using this approach, we study the CEP effects for nonsequential double ionization of argon in 4-fs laser fields at 750 nm and an intensity of 1.6x10{sup 14} W/cm{sup 2}. The Ar{sup 2+} ionization yield shows a pronounced CEP dependence which compares well with recent theoretical predictions employing quantitative rescattering theory [S. Micheau et al., Phys. Rev. A 79, 013417 (2009)]. Furthermore, we find strong CEP influences on the Ar{sup 2+} momentum spectra along the laser polarization axis.
- OSTI ID:
- 21529102
- Journal Information:
- Physical Review. A, Vol. 83, Issue 1; Other Information: DOI: 10.1103/PhysRevA.83.013412; (c) 2011 American Institute of Physics; ISSN 1050-2947
- Country of Publication:
- United States
- Language:
- English
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ARGON
ATOMS
CARRIERS
COMPARATIVE EVALUATIONS
DATA ACQUISITION
IONIZATION
IONS
LASER RADIATION
POLARIZATION
RESCATTERING
SPECTRA
STABILITY
THEORETICAL DATA
CHARGED PARTICLES
DATA
ELECTROMAGNETIC RADIATION
ELEMENTS
EVALUATION
FLUIDS
GASES
INFORMATION
NONMETALS
NUMERICAL DATA
RADIATIONS
RARE GASES
SCATTERING