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Title: Single-shot carrier-envelope-phase-tagged ion-momentum imaging of nonsequential double ionization of argon in intense 4-fs laser fields

Journal Article · · Physical Review. A
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  1. Max-Planck-Institut fuer Quantenoptik, D-85748 Garching (Germany) and J. R. Macdonald Laboratory, Department of Physics, Kansas State University, Manhattan, Kansas 66506 (United States)

Single-shot carrier-envelope-phase (CEP) tagging is combined with a reaction mircoscope (REMI) to investigate CEP-dependent processes in atoms. Excellent experimental stability and data acquisition longevity are achieved. Using this approach, we study the CEP effects for nonsequential double ionization of argon in 4-fs laser fields at 750 nm and an intensity of 1.6x10{sup 14} W/cm{sup 2}. The Ar{sup 2+} ionization yield shows a pronounced CEP dependence which compares well with recent theoretical predictions employing quantitative rescattering theory [S. Micheau et al., Phys. Rev. A 79, 013417 (2009)]. Furthermore, we find strong CEP influences on the Ar{sup 2+} momentum spectra along the laser polarization axis.

OSTI ID:
21529102
Journal Information:
Physical Review. A, Vol. 83, Issue 1; Other Information: DOI: 10.1103/PhysRevA.83.013412; (c) 2011 American Institute of Physics; ISSN 1050-2947
Country of Publication:
United States
Language:
English