Nanofabricated solid immersion lenses registered to single emitters in diamond

Journal Article · Mon Mar 28 00:00:00 EDT 2011 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3573870· OSTI ID:21518360

Marseglia, L; Hadden, J P; Stanley-Clarke, A C; Harrison, J P; Patton, B; Ho, Y.-L. D. ^[1]; Naydenov, B; Jelezko, F ^[2]; Meijer, J ^[3]; Dolan, P R; Smith, J M; Rarity, J G ^[4]; O'Brien, J L

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1. Department of Electrical and Electronic Engineering, H. H. Wills Physics Laboratory, Centre for Quantum Photonics, University of Bristol, Bristol BS8 1UB (United Kingdom)
2. 3 Physikalisches Institut and Research Center SCoPE, Universitaet Stuttgart, 70569 Stuttgart (Germany)
3. Ruhr-Universitaet Bochum, 44801 Bochum (Germany)
4. Department of Materials, University of Oxford, Oxford OX1 3PH (United Kingdom)

We describe a technique for fabricating micro- and nanostructures incorporating fluorescent defects in diamond with a positional accuracy better than hundreds of nanometers. Using confocal fluorescence microscopy and focused ion beam etching, we initially locate a suitable defect with respect to registration marks on the diamond surface then etch a structure using these coordinates. We demonstrate the technique by etching an 8 {mu}m diameter hemisphere positioned with single negatively charged nitrogen-vacancy defect lies at its origin. Direct comparison of the fluorescence photon count rate before and after fabrication shows an eightfold increase due to the presence of the hemisphere.

• OSTI ID: 21518360
• Journal Information: Applied Physics Letters, Vol. 98, Issue 13; Other Information: DOI: 10.1063/1.3573870; (c) 2011 American Institute of Physics; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ACCURACY
COLOR CENTERS
COMPARATIVE EVALUATIONS
COUNTING RATES
CRYSTAL DEFECTS
CRYSTALS
DIAMONDS
ETCHING
FLUORESCENCE
ION BEAMS
MICROSCOPY
NANOSTRUCTURES
NITROGEN
PHOTONS
SOLIDS
SPUTTERING
SURFACES
BEAMS
BOSONS
CARBON
CRYSTAL STRUCTURE
ELEMENTARY PARTICLES
ELEMENTS
EMISSION
EVALUATION
LUMINESCENCE
MASSLESS PARTICLES
MINERALS
NONMETALS
PHOTON EMISSION
POINT DEFECTS
SURFACE FINISHING
VACANCIES