Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Comparison Of Electromagnetic, Electrostatic And Permanent Magnet Quadrupole Lens Probe-Forming Systems For High Energy Ions

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3586097· OSTI ID:21513363
;  [1]
  1. Louisiana Accelerator Center/Physics Dept/, Louisiana University at Lafayette, 320 Cajundome Blvd., Lafayette Louisiana 70506 (United States)
The focusing system is an essential part of any ion microbeam system and focusing of MeV ion beams is generally accomplished using quadrupole lenses. There are two types of quadrupole lenses requiring the application of either voltage or current to provide the excitation, but there is also the possibility of utilizing lenses constructed from permanent magnets. All of these lens types have different advantages and disadvantages. Most microprobes employ electromagnetic quadrupoles for focusing, however electrostatic lenses have several advantages with respect to electromagnetic lenses, including significantly smaller size, no hysteresis effects, no heating, the utilization of highly stable voltage supplies, focusing which is independent of ion mass, and construction from industrial grade materials. The main advantage of the permanent magnetic lens is that it does not require the application of external power which can significantly reduce the overall lifetime cost. In this presentation, the short probe-forming systems comprised from all these types of quadrupole lenses are compared and the smallest beam spot size and appropriate optimal parameters of these probe-forming systems are determined.
OSTI ID:
21513363
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1336; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

Similar Records

Permanent quadrupole magnets
Conference · Wed Dec 31 23:00:00 EST 1975 · OSTI ID:7237008

Magnetic quadrupole doublet focusing system for high energy ions
Journal Article · Sat Mar 15 00:00:00 EDT 2008 · Review of Scientific Instruments · OSTI ID:21123837

Obtaining 3-150 MeV Focused Particle Microbeams
Journal Article · Tue Aug 26 00:00:00 EDT 2003 · AIP Conference Proceedings · OSTI ID:20632596