Synthesis of Endohedral Fullerene Using ECR Ion Source
Journal Article
·
· AIP Conference Proceedings
- Graduate School of Engineering, Toyo University, 2100 Kujirai, Kawagoe, Saitama (Japan)
- Bio-Nano Electronics Research Centre, Toyo University, 2100 Kujirai, Kawagoe, Saitama (Japan)
- Tateyama Machine Co., Ltd., 30 Shimonoban, Toyama, Toyama (Japan)
- National Institute of Radiological Sciences (NIRS), 4-9-1 Anagawa, Inage, Chiba (Japan)
- Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka (Japan)
- Institute of Nuclear Research (ATOMKI), H-4026 Debrecen (Hungary)
We are developing an ECRIS apparatus which is designed for the production of endohedral fullerenes. Our promising approaches to produce the endohedral fullerenes using the ECRIS are the ion-ion collision reaction of fullerenes and the other atom in their mixture plasma and simple ion implantation of atom into fullerene layer. In this study, we tried to synthesize the endohedral nitrogen-fullerenes by ion implantation. N{sup +} beam was irradiated to a fullerene target with a specific energy and dose. As a result, we could observe the peak of N+C{sub 60} from targets after N{sup +} beam irradiation with TOF-SIMS and LDI-TOF-MS.
- OSTI ID:
- 21511444
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1321; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMS
BEAMS
CARBON
CHARGED PARTICLES
CHEMICAL ANALYSIS
COLLISIONS
CYCLOTRON RESONANCE
DISPERSIONS
DOSES
ECR ION SOURCES
ELEMENTS
EQUIPMENT
FULLERENES
ION COLLISIONS
ION IMPLANTATION
ION MICROPROBE ANALYSIS
ION SOURCES
ION-ION COLLISIONS
IONS
IRRADIATION
LAYERS
MASS SPECTROSCOPY
MICROANALYSIS
MIXTURES
NITROGEN
NITROGEN IONS
NONDESTRUCTIVE ANALYSIS
NONMETALS
PEAKS
PLASMA
RESONANCE
SPECTROSCOPY
SYNTHESIS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMS
BEAMS
CARBON
CHARGED PARTICLES
CHEMICAL ANALYSIS
COLLISIONS
CYCLOTRON RESONANCE
DISPERSIONS
DOSES
ECR ION SOURCES
ELEMENTS
EQUIPMENT
FULLERENES
ION COLLISIONS
ION IMPLANTATION
ION MICROPROBE ANALYSIS
ION SOURCES
ION-ION COLLISIONS
IONS
IRRADIATION
LAYERS
MASS SPECTROSCOPY
MICROANALYSIS
MIXTURES
NITROGEN
NITROGEN IONS
NONDESTRUCTIVE ANALYSIS
NONMETALS
PEAKS
PLASMA
RESONANCE
SPECTROSCOPY
SYNTHESIS