Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Drive frequency dependent phase imaging in piezoresponse force microscopy

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3474956· OSTI ID:21480237
; ; ; ; ; ; ; ;  [1]
  1. Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093 (China)
The drive frequency dependent piezoresponse (PR) phase signal in near-stoichiometric lithium niobate crystals is studied by piezoresponse force microscopy. It is clearly shown that the local and nonlocal electrostatic forces have a great contribution to the PR phase signal. The significant PR phase difference of the antiparallel domains are observed at the contact resonances, which is related to the electrostatic dominated electromechanical interactions of the cantilever and tip-sample system. Moreover, the modulation voltage induced frequency shift at higher eigenmodes could be attributed to the change of indention force depending on the modulation amplitude with a piezoelectric origin. The PR phase of the silicon wafer is also measured for comparison. It is certificated that the electrostatic interactions are universal in voltage modulated scanning probe microscopy and could be extended to other phase imaging techniques.
OSTI ID:
21480237
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 4 Vol. 108; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English