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Title: Nanoheteroepitaxy of gallium arsenide on strain-compliant silicon-germanium nanowires

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3465327· OSTI ID:21476356
; ;  [1]; ; ; ;  [2]; ;  [3]
  1. Department of Electrical and Computer Engineering, National University of Singapore (NUS), Singapore 117576 (Singapore)
  2. School of Electrical and Electronic Engineering, Nanyang Technological University (NTU), Nanyang Avenue, Singapore 639798 (Singapore)
  3. Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University (NTU), Singapore 637371 (Singapore)

Heterogeneous integration of high-quality GaAs on Si-based substrates using a selective migration-enhanced epitaxy (MEE) of GaAs on strain-compliant SiGe nanowires was demonstrated for the first time. The physics of compliance in nanoscale heterostructures was captured and studied using finite-element simulation. It is shown that nanostructures can provide additional substrate compliance for strain relief and therefore contribute to the formation of defect-free GaAs on SiGe. Extensive characterization using scanning electron microscopy and cross-sectional transmission electron microscopy was performed to illustrate the successful growth of GaAs on SiGe nanowire. Raman and Auger electron spectroscopy measurements further confirmed the quality of the GaAs grown and the high growth selectivity of the MEE process.

OSTI ID:
21476356
Journal Information:
Journal of Applied Physics, Vol. 108, Issue 2; Other Information: DOI: 10.1063/1.3465327; (c) 2010 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English