Algorithm for calculating the optimal parameters of multilayer aperiodic mirrors for soft X-rays

Journal Article · Mon Feb 28 04:00:00 EST 2005 · Quantum Electronics (Woodbury, N.Y.)

DOI:https://doi.org/10.1070/QE2005V035N02ABEH003728· OSTI ID:21470698

Burenkov, D S; Uspenskii, Yu A; Artyukov, I A; Vinogradov, Aleksandr V ^[1]

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1. P.N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow (Russian Federation)

A new algorithm is proposed for optimising the thickness of layers in multilayer aperiodic mirrors. An important feature of the algorithm is the separation of the explicit dependence of the reflection coefficient on the thickness of one layer. This reduces the amount of calculations required for the mirror optimisation by a factor of N (N is the number of layers of the mirror). The algorithm allows one to perform optimisation of different types: the obtaining of the maximum reflection coefficient at one frequency, the maximum of the integrated reflection coefficient within a specified frequency interval, the constant reflection coefficient in the working frequency or angular interval, etc. Examples of practical applications of the algorithm demonstrating its efficiency and versatility are presented. (laser applications and other topics in quantum electronics)

• OSTI ID: 21470698
• Journal Information: Quantum Electronics (Woodbury, N.Y.), Journal Name: Quantum Electronics (Woodbury, N.Y.) Journal Issue: 2 Vol. 35; ISSN 1063-7818
• Country of Publication: United States
• Language: English

Related Subjects

07 ISOTOPE AND RADIATION SOURCES
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
97 MATHEMATICS AND COMPUTING
ALGORITHMS
DIMENSIONS
EFFICIENCY
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
LAYERS
MATHEMATICAL LOGIC
MIRRORS
OPTIMIZATION
RADIATIONS
REFLECTION
SOFT X RADIATION
THICKNESS
X RADIATION