Time-domain diffuse optical tomography using analytic statistical characteristics of photon trajectories

Journal Article · Thu Nov 30 04:00:00 EST 2006 · Quantum Electronics (Woodbury, N.Y.)

DOI:https://doi.org/10.1070/QE2006V036N11ABEH013302· OSTI ID:21456913

Konovalov, Aleksandr B; Vlasov, V V ^[1]; Kalintsev, A G; Lyubimov, Vladimir V ^[2]; Kravtsenyuk, Olga V ^[3]

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1. E.I. Zababakhin All-Russian Scientific-Research Institute of Technical Physics, Russian Federal Nuclear Centre, Snezhinsk, Chelyabinsk region (Russian Federation)
2. Research Institute for Laser Physics, St. Petersburg (Russian Federation)
3. Foundation for Research and Technology-Hellas (IESL-FORTH), Institute of Electronic Structure and Lasers, Crete (Greece)

The inverse problem of diffuse optical tomography (DOT) is reduced by the method of photon average trajectories (PAT) to the solution of the integral equation integrated along the conditional mean statistical photon trajectory. The PAT bending near the flat boundary of a scattering medium is estimated analytically. These estimates are used to determine the analytic statistical characteristics of photon trajectories for the flat layer geometry. The inverse DOT problem is solved by using the multiplicative algebraic algorithm modified to improve the convergence of the iteration reconstruction process. The numerical experiment shows that the modified PAT method permits the reconstruction of near-surface optical inhomogeneities virtually without distortions. (special issue devoted to multiple radiation scattering in random media)

• OSTI ID: 21456913
• Journal Information: Quantum Electronics (Woodbury, N.Y.), Journal Name: Quantum Electronics (Woodbury, N.Y.) Journal Issue: 11 Vol. 36; ISSN 1063-7818
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ALGORITHMS
BOSONS
CONVERGENCE
DIAGNOSTIC TECHNIQUES
ELEMENTARY PARTICLES
EQUATIONS
INTEGRAL EQUATIONS
LAYERS
MASSLESS PARTICLES
MATHEMATICAL LOGIC
MATHEMATICAL SOLUTIONS
OPTICAL PROPERTIES
PHOTONS
PHYSICAL PROPERTIES
SCATTERING
SURFACES
TOMOGRAPHY
TRAJECTORIES