Applicability of the effective index method for simulating ridge optical waveguides

Journal Article · Sun Apr 30 04:00:00 EDT 2006 · Quantum Electronics (Woodbury, N.Y.)

DOI:https://doi.org/10.1070/QE2006V036N04ABEH013149· OSTI ID:21456874

Batrak, D V; Plisyuk, S A ^[1]

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1. P.N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow (Russian Federation)

The accuracy of the effective index method in calculations of ridge optical waveguides is estimated by comparing the results of calculations with the results obtained by the finite element method. A comparison of the values of the refractive index for the fundamental mode and the corresponding near and far-field intensity distributions for the waveguide structure typical of semiconductor ridge lasers emitting at 0.98 {mu}m demonstrates a rather high accuracy of the effective index method in calculations of ridge waveguide structures and radiative characteristics of semiconductor lasers based on them. (optical fibres and waveguides)

• OSTI ID: 21456874
• Journal Information: Quantum Electronics (Woodbury, N.Y.), Journal Name: Quantum Electronics (Woodbury, N.Y.) Journal Issue: 4 Vol. 36; ISSN 1063-7818
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ACCURACY
CALCULATION METHODS
COMPARATIVE EVALUATIONS
DOCUMENT TYPES
EVALUATION
FIBERS
FINITE ELEMENT METHOD
INDEXES
LASERS
MATERIALS
MATHEMATICAL SOLUTIONS
NUMERICAL SOLUTION
OPTICAL FIBERS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
REFRACTIVE INDEX
SEMICONDUCTOR DEVICES
SEMICONDUCTOR LASERS
SEMICONDUCTOR MATERIALS
SOLID STATE LASERS
WAVEGUIDES