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Damage Mechanisms In Polymers Upon NIR Femtosecond Pulse Laser Irradiation: Sub-Threshold Processes And Their Implications For Laser Safety Applications

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3507148· OSTI ID:21454846
;  [1];  [2];  [3];  [4]
  1. BAM Bundesanstalt fuer Materialforschung und -pruefung, Unter den Eichen 87, D-12205 Berlin (Germany)
  2. Laser Processing Group, Instituto de Optica, CSIC, Serrano 121, E-28006 Madrid (Spain)
  3. Friedrich-Schiller-Universitaet Jena, Max-Wien-Platz 1, D-07743 Jena (Germany)
  4. Paul Scherrer Institut, CH-5232 Villigen (Switzerland)
This contribution investigates laser-induced damage of thin film and bulk polymer samples, with the focus on physical processes occurring close to the damage threshold. In-situ real-time reflectivity (RTR) measurements with picosecond (ps) and nanosecond (ns) temporal resolution were performed on thin polymer films on a timescale up to a few microseconds ({mu}s). A model for polymer thin film damage is presented, indicating that irreversible chemical modification processes take place already below the fluence threshold for macroscopic damage. On dye-doped bulk polymer filters (as used for laser goggles), transmission studies using fs-and ps-laser pulses reveal the optical saturation behavior of the material and its relation to the threshold of permanent damage. Implications of the sub-threshold processes for laser safety applications will be discussed for thin film and bulk polymer damage.
OSTI ID:
21454846
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1278; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English