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Title: TESTING THE DISTANCE-DUALITY RELATION WITH GALAXY CLUSTERS AND TYPE Ia SUPERNOVAE

Journal Article · · Astrophysical Journal Letters
;  [1]
  1. Departamento de Astronomia, Universidade de Sao Paulo-USP, 05508-900 Sao Paulo, SP (Brazil)

In this Letter, we propose a new and model-independent cosmological test for the distance-duality (DD) relation, {eta} = D{sub L} (z)(1 + z){sup -2}/D{sub A} (z) = 1, where D{sub L} and D{sub A} are, respectively, the luminosity and angular diameter distances. For D{sub L} we consider two sub-samples of Type Ia supernovae (SNe Ia) taken from Constitution data whereas D{sub A} distances are provided by two samples of galaxy clusters compiled by De Filippis et al. and Bonamente et al. by combining Sunyaev-Zeldovich effect and X-ray surface brightness. The SNe Ia redshifts of each sub-sample were carefully chosen to coincide with the ones of the associated galaxy cluster sample ({Delta}z < 0.005), thereby allowing a direct test of the DD relation. Since for very low redshifts, D{sub A} (z) ape D{sub L} (z), we have tested the DD relation by assuming that {eta} is a function of the redshift parameterized by two different expressions: {eta}(z) = 1 + {eta}{sub 0} z and {eta}(z) = 1 + {eta}{sub 0} z/(1 + z), where {eta}{sub 0} is a constant parameter quantifying a possible departure from the strict validity of the reciprocity relation ({eta}{sub 0} = 0). In the best scenario (linear parameterization), we obtain {eta}{sub 0} = -0.28{sup +0.44} {sub -0.44} (2{sigma}, statistical + systematic errors) for the De Filippis et al. sample (elliptical geometry), a result only marginally compatible with the DD relation. However, for the Bonamente et al. sample (spherical geometry) the constraint is {eta}{sub 0} = -0.42{sup +0.34} {sub -0.34} (3{sigma}, statistical + systematic errors), which is clearly incompatible with the duality-distance relation.

OSTI ID:
21452726
Journal Information:
Astrophysical Journal Letters, Vol. 722, Issue 2; Other Information: DOI: 10.1088/2041-8205/722/2/L233; ISSN 2041-8205
Country of Publication:
United States
Language:
English