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Projection of excited orbitals into kinetic energies of emitted electrons in resonant Si KLL Auger decays of SiF{sub 4}

Journal Article · · Physical Review. A
 [1]; ; ;  [2]; ;  [3];  [4]; ;  [5]
  1. Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba 305-0801 (Japan)
  2. Department of Chemistry, Faculty of Science, Ehime University, Matsuyama 790-8577 (Japan)
  3. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577 (Japan)
  4. Department of Chemistry, Graduate School of Science, Hiroshima University, Higashi-Hiroshima 739-8526 (Japan)
  5. Japan Synchrotron Radiation Research Institute/SPring-8, 1-1-1 Kouto, Sayo-cho, Sayo-gun 679-5198 (Japan)

Spectator resonant Auger-electron spectra have been measured in the Si 1s photoexcitation region of SiF{sub 4} using an electron spectroscopic technique combined with undulator radiation. A transition with the highest intensity in the total ion yield spectrum, which comes from excitation of a 1s electron into the 6t{sub 2} valence orbital, generates resonant Auger decays in which the excited electron remains predominantly in the valence orbital or is partly shaken up into a high-lying Rydberg orbital. The higher-lying peak generated through excitation into Rydberg orbitals induces resonant Auger decays in which the excited Rydberg electron is partly shaken up to a higher-lying Rydberg orbital or shaken down to a lower-lying valence molecular orbital. These findings exhibit a clear disentanglement effect among excited orbitals which are smeared out in the 1s electron excitation spectrum.

OSTI ID:
21452623
Journal Information:
Physical Review. A, Journal Name: Physical Review. A Journal Issue: 4 Vol. 82; ISSN 1050-2947; ISSN PLRAAN
Country of Publication:
United States
Language:
English