Probing photoelectron multiple interferences via Fourier spectroscopy in energetic photoionization of Xe-C{sub 60}

Journal Article · Wed Sep 15 04:00:00 EDT 2010 · Physical Review. A

DOI:https://doi.org/10.1103/PHYSREVA.82.033201· OSTI ID:21450568

Potter, Andrea; McCune, Matthew A; De, Ruma; Chakraborty, Himadri S ^[1]; Madjet, Mohamed E ^[2]

---

1. Center for Innovation and Entrepreneurship, Department of Chemistry and Physics, Northwest Missouri State University, Maryville, Missouri 64468 (United States)
2. Institute of Chemistry and Biochemistry, Free University, Fabeckstrasse 36a, D-14195 Berlin (Germany)

Considering the photoionization of the Xe-C{sub 60} endohedral compound, we study in detail the ionization cross sections of various levels of the system at energies higher than the plasmon resonance region. Five classes of single-electron levels are identified depending on their spectral character. Each class engenders distinct oscillations in the cross section, emerging from the interference between active ionization modes specific to that class. Analysis of the cross sections based on their Fourier transforms unravels oscillation frequencies that carry unique fingerprints of the emitting level.

• OSTI ID: 21450568
• Journal Information: Physical Review. A, Journal Name: Physical Review. A Journal Issue: 3 Vol. 82; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
ABSORPTION SPECTROSCOPY
ATOM COLLISIONS
CARBON
COLLISIONS
CROSS SECTIONS
ELECTRONS
ELEMENTARY PARTICLES
ELEMENTS
ENERGY LEVELS
FERMIONS
FLUIDS
FOURIER TRANSFORMATION
FULLERENES
GASES
INTEGRAL TRANSFORMATIONS
INTERFERENCE
IONIZATION
LEPTONS
MOLECULE COLLISIONS
NONMETALS
OSCILLATIONS
PHOTOIONIZATION
PHOTON COLLISIONS
PHOTON-ATOM COLLISIONS
PHOTON-MOLECULE COLLISIONS
PLASMONS
QUASI PARTICLES
RARE GASES
RESONANCE
SPECTROSCOPY
TRANSFORMATIONS
XENON