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Title: A numerical study of geometry dependent errors in velocity, temperature, and density measurements from single grid planar retarding potential analyzers

Journal Article · · Physics of Plasmas
DOI:https://doi.org/10.1063/1.3457931· OSTI ID:21432235
; ;  [1];  [2]
  1. William B. Hanson Center for Space Sciences, University of Texas at Dallas, 800 W. Campbell Road, WT15, Richardson, Texas 75080 (United States)
  2. Space Weather Laboratory/Code 674, Goddard Space Flight Center, Greenbelt, Maryland 20771 (United States)

Planar retarding potential analyzers (RPAs) have been utilized numerous times on high profile missions such as the Communications/Navigation Outage Forecast System and the Defense Meteorological Satellite Program to measure plasma composition, temperature, density, and the velocity component perpendicular to the plane of the instrument aperture. These instruments use biased grids to approximate ideal biased planes. These grids introduce perturbations in the electric potential distribution inside the instrument and when unaccounted for cause errors in the measured plasma parameters. Traditionally, the grids utilized in RPAs have been made of fine wires woven into a mesh. Previous studies on the errors caused by grids in RPAs have approximated woven grids with a truly flat grid. Using a commercial ion optics software package, errors in inferred parameters caused by both woven and flat grids are examined. A flat grid geometry shows the smallest temperature and density errors, while the double thick flat grid displays minimal errors for velocities over the temperature and velocity range used. Wire thickness along the dominant flow direction is found to be a critical design parameter in regard to errors in all three inferred plasma parameters. The results shown for each case provide valuable design guidelines for future RPA development.

OSTI ID:
21432235
Journal Information:
Physics of Plasmas, Vol. 17, Issue 8; Other Information: DOI: 10.1063/1.3457931; (c) 2010 American Institute of Physics; ISSN 1070-664X
Country of Publication:
United States
Language:
English