Nanoscale chemical imaging using synchrotron x-ray enhanced scanning tunneling microscopy
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
The combination of synchrotron radiation with scanning tunneling microscopy provides a promising new concept for chemical imaging of nanoscale structures. It employs detection of local x-ray absorption, which directly yields chemical, electronic, and magnetic sensitivity. The study of the tip current in the far field (800 nm tip/sample separation) shows that insulator-coated tips have to be considered in order to reduce the background from stray photoelectron. A picture of the different channels contributing to the x-ray enhanced STM process is proposed. If during electron tunneling the sample is illuminated with monochromatic x-rays, characteristic absorption will arise, and core electrons are excited, which might modulate the conventional tunnel current and facilitate chemical imaging at the nanoscale.
- OSTI ID:
- 21431070
- Journal Information:
- AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463236; (c) 2010 American Institute of Physics; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
DETECTION
ELECTRONS
MONOCHROMATIC RADIATION
NANOSTRUCTURES
SCANNING TUNNELING MICROSCOPY
SENSITIVITY
SYNCHROTRON RADIATION
SYNCHROTRONS
TUNNEL EFFECT
X RADIATION
ACCELERATORS
BREMSSTRAHLUNG
CYCLIC ACCELERATORS
ELECTROMAGNETIC RADIATION
ELEMENTARY PARTICLES
FERMIONS
IONIZING RADIATIONS
LEPTONS
MICROSCOPY
RADIATIONS
SORPTION