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Title: Overview of the SPring-8 Diagnostics Beamlines

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3463223· OSTI ID:21410261
; ; ; ; ; ; ; ; ; ;  [1];  [2]
  1. Japan Synchrotron Radiation Research Institute, SPring-8, Sayo, Hyogo, 679-5198 (Japan)
  2. Center of Advanced Metrology, Chubu University, Kasugai, Aichi, 487-8501 (Japan)

We present an overview of the two SPring-8 diagnostics beamlines, the beamline I (dipole magnet source) and II (insertion device source). At the beamline I, synchrotron radiation (SR) in both the X-ray and the visible bands is exploited for characterizations of the electron beam. At the beamline II, by observing the spectral, spatial, and temporal characteristics of X-ray SR of the insertion device (ID), new techniques for accelerator diagnostics are investigated. Irradiation experiments with the ID to develop accelerator components such as photon absorbers, and production of intensive 10 MeV {gamma}-rays by backward Compton scattering of external far infrared (FIR) laser photons are being prepared at the beamline II.

OSTI ID:
21410261
Journal Information:
AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463223; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English