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Title: Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3463161· OSTI ID:21410217
; ;  [1];  [2];  [1]
  1. Japan Synchrotron Radiation Research Institute, 1-1-1 Kouto, Sayo, Sayo, Hyogo 679-5198 (Japan)
  2. Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075 (Japan)

Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2x2x2 {mu}m{sup 3} cytidine, 600x600x300 nm{sup 3} BaTiO{sub 3}, and 1x1x1 {mu}m{sup 3} silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendelloesung method and do not require absorption and extinction corrections.

OSTI ID:
21410217
Journal Information:
AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463161; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English