KLL dielectronic recombination resonant strengths of He-like up to O-like xenon ions

Journal Article · Mon Feb 15 04:00:00 EST 2010 · Physical Review. A

DOI:https://doi.org/10.1103/PHYSREVA.81.022714· OSTI ID:21408240

Yao, K; Geng, Z; Xiao, J; Yang, Y; Chen, C; Fu, Y; Lu, D; Hutton, R; Zou, Y ^[1]

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1. Key Laboratory of Applied Ion Beam Physics, Ministry of Education (China)

In this work, the KLL dielectronic recombination (DR) resonant strengths of He- through to O-like Xe ions were studied, both through experiment and calculation. The experiments were done using a fast electron beam-energy scanning technique at the Shanghai electron beam ion trap. The calculations were done by using the flexible atomic code (FAC), in which the relativistic configuration interaction (RCI) method was employed. For the total resonant strengths, the present experimental and theoretical results for He-, Be-, B-, C-, N-, and O-like Xe ions agree within experimental uncertainties (about 9%). But the experimental result for Li-like Xe is 14% higher than the calculation. The present FAC calculations of the total DR strengths were compared with the available previous calculations, using RCI or multiconfiguration Dirac-Fock (MCDF) methods, and the agreement was very good. In this work, some intermediate-state resolved KLL DR strengths were also obtained and compared with theoretical results, and more discrepancies were revealed.

• OSTI ID: 21408240
• Journal Information: Physical Review. A, Journal Name: Physical Review. A Journal Issue: 2 Vol. 81; ISSN 1050-2947; ISSN PLRAAN
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
BEAMS
CHARGED PARTICLES
CONFIGURATION INTERACTION
ELECTRON BEAMS
ENERGY RANGE
INTERMEDIATE STATE
IONS
LEPTON BEAMS
PARTICLE BEAMS
RECOMBINATION
RELATIVISTIC RANGE
TRAPS
XENON IONS