Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Observations of low-aberration plasma lens focusing of relativistic electron beams at the underdense threshold

Journal Article · · Physics of Plasmas
DOI:https://doi.org/10.1063/1.3457924· OSTI ID:21389134
 [1]; ; ;  [1];  [2];  [3]; ; ;  [3]; ;  [4]
  1. Department of Physics and Astronomy, University of California, Los Angeles, California 90095 (United States)
  2. Far-Tech, Inc., San Diego, California 92121 (United States)
  3. Fermi National Accelerator Laboratory, Batavia, Illinois 60510 (United States)
  4. University of Rochester, Rochester, New York 14627 (United States)
Focusing of a 15 MeV electron bunch by a plasma lens operated at the threshold of the underdense regime has been demonstrated. The strong, 1.7 cm focal length, plasma lens focused both transverse directions simultaneously and reduced the minimum area of the beam spot by a factor of 23. It is shown through analytic analysis and simulation that the observed spherical aberration of this underdense lens, when expressed as the fractional departure of the focusing strength from its linear expectation, is DELTAK/K=0.08+-0.04. This is significantly lower than the minimum theoretical value for the spherical aberration of an overdense plasma lens. Parameter scans showing the dependence of focusing performance on beam charge, as well as time resolved measurements of the focused electron bunch, are reported.
OSTI ID:
21389134
Journal Information:
Physics of Plasmas, Journal Name: Physics of Plasmas Journal Issue: 7 Vol. 17; ISSN PHPAEN; ISSN 1070-664X
Country of Publication:
United States
Language:
English

Similar Records

Observations of underdense plasma lens focusing of relativistic electron beams
Conference · Fri Jun 01 00:00:00 EDT 2007 · OSTI ID:917844

UCLA/FNPL Underdense Plasma Lens Experiment: Results and Analysis
Conference · Fri Aug 04 00:00:00 EDT 2006 · OSTI ID:894760

UCLA/FNPL Underdense Plasma Lens Experiment: Results and Analysis
Journal Article · Sun Nov 26 23:00:00 EST 2006 · AIP Conference Proceedings · OSTI ID:20898724