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Title: Interface width effect on the classical Rayleigh-Taylor instability in the weakly nonlinear regime

Journal Article · · Physics of Plasmas
DOI:https://doi.org/10.1063/1.3396369· OSTI ID:21371107
 [1];  [1];  [2]
  1. LCP, Institute of Applied Physics and Computational Mathematics, Beijing 100088 (China)
  2. State Key Laboratory for Geomechanics and Deep Underground Engineering, China University of Mining and Technology, Beijing 100083 (China)

In this paper, the interface width effects (i.e., the density gradient effects or the density transition layer effects) on the Rayleigh-Taylor instability (RTI) in the weakly nonlinear (WN) regime are investigated by numerical simulation (NS). It is found that the interface width effects dramatically influence the linear growth rate in the linear growth regime and the mode coupling process in the WN growth regime. First, the interface width effects decrease the linear growth rate of the RTI, particularly for the short perturbation wavelengths. Second, the interface width effects suppress (reduce) the third-order feedback to the fundamental mode, which induces the nonlinear saturation amplitude (NSA) to exceed the classical prediction, 0.1lambda. The wider the density transition layer is, the larger the NSA is. The NSA in our NS can reach a half of its perturbation wavelength. Finally, the interface width effects suppress the generation and the growth of the second and the third harmonics. The ability to suppress the harmonics' growth increases with the interface width but decreases with the perturbation wavelength. On the whole, in the WN regime, the interface width effects stabilize the RTI, except for an enhancement of the NSA, which is expected to improve the understanding of the formation mechanism for the astrophysical jets, and for the jetlike long spikes in the high energy density physics.

OSTI ID:
21371107
Journal Information:
Physics of Plasmas, Vol. 17, Issue 5; Other Information: DOI: 10.1063/1.3396369; (c) 2010 American Institute of Physics; ISSN 1070-664X
Country of Publication:
United States
Language:
English