Phase equilibria in systems Ce-M-Sb (M=Si, Ge, Sn) and superstructure Ce{sub 12}Ge{sub 9-x}Sb{sub 23+x} (x=3.8+-0.1)
- Institute of Physical Chemistry, University of Vienna, Waehringerstr. 42, 1090 Wien (Austria)
- Dipartimento di Chimica e Chimica Industriale, Universita di Genova, Via Dodecaneso 31, I-16146 Genova (Italy)
- Institut fuer Mineralogie und Kristallographie, Universitaet Wien, Althanstrasse 14, A-1090 Wien (Austria)
Phase relations in the ternary systems Ce-M-Sb (M=Si, Ge, Sn) in composition regions CeSb{sub 2}-Sb-M were studied by optical and electron microscopy, X-ray diffraction, and electron probe microanalysis on arc-melted alloys and specimens annealed in the temperature region from 850 to 200 deg. C. The results, in combination with an assessment of all literature data available, were used to construct solidus surfaces and a series of isothermal sections. No ternary compounds were found to form in the Ce-Si-Sb system whilst Ce{sub 12}Ge{sub 9-x}Sb{sub 23+x} (3.3<x<4.2) and CeSn{sub x}Sb{sub 2} (0.1<x<0.8) participate in phase equilibria in the composition region investigated. Crystallographic parameters for the ternary compound Ce{sub 12}Ge{sub 9-x}Sb{sub 23+x} (x=3.8+-0.1) were determined from X-ray single crystal and powder diffraction. For the binary system Ge-Sb a eutectic was defined Lreversible(Ge)+(Sb) at 591.6 deg. C and 22.5 at%. Ge EPMA revealed a maximal solubility of 6.3 at% Ge in (Sb) at the eutectic temperature. - Graphical abstract: Phase relations in the ternary systems Ce-M-Sb (M=Si, Ge, Sn) in composition regions CeSb{sub 2}-Sb-M have been studied by optical and electron microscopy, XRD and EPMA on as cast alloys and specimens annealed in the temperature region 200-850 deg. C.
- OSTI ID:
- 21370322
- Journal Information:
- Journal of Solid State Chemistry, Vol. 182, Issue 4; Other Information: DOI: 10.1016/j.jssc.2008.12.009; PII: S0022-4596(08)00642-7; Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; ISSN 0022-4596
- Country of Publication:
- United States
- Language:
- English
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