Nonlinear refraction properties of nickel oxide thin films at 800 nm

Journal Article · Sun Nov 01 00:00:00 EDT 2009 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3254233· OSTI ID:21361906

Silva, Blenio J. P. da; Azevedo, A; Araujo, Cid B. de ^[1]

---

1. Departamento de Fisica, Universidade Federal de Pernambuco, Recife 50670-901, PE (Brazil)

Measurements of the nonlinear refractive index, n{sub 2}, of nickel oxide films prepared by controlled oxidation of nickel films deposited on substrates of soda-lime glass are reported. The structure and morphology of the samples were characterized by scanning electron microscopy, atomic force microscopy, and x-ray diffractometry. Samples of excellent optical quality were prepared. The nonlinear measurements were performed using the thermally managed eclipse Z-scan technique at 800 nm. A large value of n{sub 2}approx =10{sup -12} cm{sup 2}/W and negligible nonlinear absorption were obtained.

• OSTI ID: 21361906
• Journal Information: Journal of Applied Physics, Vol. 106, Issue 9; Other Information: DOI: 10.1063/1.3254233; (c) 2009 American Institute of Physics; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
ATOMIC FORCE MICROSCOPY
CRYSTALS
ECLIPSE
GLASS
MORPHOLOGY
NICKEL OXIDES
NONLINEAR PROBLEMS
OXIDATION
REFRACTION
REFRACTIVE INDEX
SCANNING ELECTRON MICROSCOPY
SODIUM CARBONATES
SUBSTRATES
THIN FILMS
X-RAY DIFFRACTION
ALKALI METAL COMPOUNDS
CARBON COMPOUNDS
CARBONATES
CHALCOGENIDES
CHEMICAL REACTIONS
COHERENT SCATTERING
DIFFRACTION
ELECTRON MICROSCOPY
FILMS
MICROSCOPY
NICKEL COMPOUNDS
OPTICAL PROPERTIES
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SCATTERING
SODIUM COMPOUNDS
SORPTION
TRANSITION ELEMENT COMPOUNDS