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Title: Influence of gas pressure and applied voltage on Xe excimer radiation from a micro dielectric barrier discharge for plasma display panel

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3236508· OSTI ID:21361856
; ;  [1];  [2]
  1. Graduate School of Advanced Science of Matter, Hiroshima University, Higashi-Hiroshima 739-8530 (Japan)
  2. Graduate School of Science and Engineering, Tokyo Metropolitan University, Hachioji 192-0397 (Japan)

We present the influence of gas pressure and applied voltage on Xe excimer radiation from a microdielectric barrier discharge (micro-DBD) in Ne/Xe gas mixture for plasma display panel. Measurements show that the excimer radiation with the 172 nm band lines is strongly observed in the afterglow, and drastically increases with an increase in gas pressure and applied voltage. It is also found that for high gas pressure and low voltage, excimer molecule (Xe{sub 2}{sup *}) is efficiently produced because of less infrared emission from Xe excited atom. The reaction processes of Xe metastable atom (Xe{sub 1s5}{sup *}), which is a precursor for Xe{sub 2}{sup *}, are theoretically analyzed using a one-dimensional fluid model. Increasing gas pressure results in large excimer radiation due to the enhancement of the following three processes, i.e., the conversion process from Xe{sub 1s5}{sup *} to Xe{sub 2}{sup *}, the direct electron impact excitation from ground state to Xe{sub 1s5}{sup *}, and the collisional de-excitation process from upper level (Xe{sup **}) to Xe{sub 1s5}{sup *}. The simulation analytical result shows that for lower voltage, Xe{sub 1s5}{sup *} is efficiently produced due to the increase in the ratio of direct excitation to Xe{sub 1s5}{sup *} from ground state and the suppression of the stepwise ionization from Xe{sub 1s5}{sup *} by electron collisions. While for high voltage operation of micro-DBD, the recombination process with Xe molecular ion (Xe{sub 2}{sup +}) and electron contributes to the total excimer radiation, which can be responsible for the large excimer radiation observed in experiment.

OSTI ID:
21361856
Journal Information:
Journal of Applied Physics, Vol. 106, Issue 7; Other Information: DOI: 10.1063/1.3236508; (c) 2009 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English