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Title: Soft x-ray yield from NX2 plasma focus

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3176489· OSTI ID:21359316
 [1]; ;  [2];  [1]
  1. Institute for Plasma Focus Studies, 32 Oakpark Drive, Chadstone, Victoria 3148 (Australia)
  2. Natural Sciences and Science Education, National Institute of Education, Nanyang Technological University, Singapore 637616 (Singapore)

The Lee model code is used to compute neon soft x-ray yield Y{sub sxr} for the NX2 plasma focus as a function of pressure. Comparison with measured Y{sub sxr} shows reasonable agreement in the Y{sub sxr} versus pressure curve, the absolute maximum yield as well as the optimum pressure. This gives confidence that the code gives a good representation of the neon plasma focus in terms of gross properties including speeds and trajectories and soft x-ray yields, despite its lack of modeling localized regions of higher densities and temperatures. Computed current curves versus pressure are presented and discussed particularly in terms of the dynamic resistance of the axial phase. Computed gross properties of the plasma focus including peak discharge current I{sub peak}, pinch current I{sub pinch}, minimum pinch radius r{sub min}, plasma density at the middle duration of pinch n{sub pinch}, and plasma temperature at middle duration of pinch T{sub pinch} are presented and the trends in variation of these are discussed to explain the peaking of Y{sub sxr} at optimum pressure.

OSTI ID:
21359316
Journal Information:
Journal of Applied Physics, Vol. 106, Issue 2; Other Information: DOI: 10.1063/1.3176489; (c) 2009 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English