Toward determinism in surface damaging of dielectrics using few-cycle laser pulses
- Laboratoire LP3, UMR 6182 CNRS, Universite de la Mediterranee, C. 917, 163, Av. de Luminy, 13288 Marseille, Cedex 9 (France)
- INRS, Energie, Materiaux et Telecommunications, 1650 Bld. Lionel Boulet, Varennes, Quebec, J3X 1S2 (Canada)
We introduce a quantitative measurement of the determinism of laser-induced damaging at the surface of a dielectric material, e.g., fused silica. Using laser pulses ranging from 7 to 300 fs, we demonstrate that laser damage occurrence tends to be dramatically deterministic at 7 fs, which is attributed to the increasing importance of tunneling ionization as the major channel for the generation of free-carriers in the conduction band.
- OSTI ID:
- 21347272
- Journal Information:
- Applied Physics Letters, Vol. 96, Issue 7; Other Information: DOI: 10.1063/1.3309700; (c) 2010 American Institute of Physics; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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