Ion Beam And Plasma Jet Generated By A 3 kJ Plasma Focus
- Plasma Research Laboratory, Physics Department, Science Faculty, University of Malaya, 50603 Kuala Lumpur (Malaysia)
- Solid State Research Laboratory, Physics Department, Science Faculty, University of Malaya, 50603 Kuala Lumpur (Malaysia)
The plasma focus device is well known as a copious source of X-ray, neutrons, ion and electron beams. In this work, the characteristics of energetic ion beam emission in a 3 kJ Mather-type plasma focus is studied. The plasma focus system is operated at low pressure with argon as the working gas. The objective of the project is to obtain the argon ion beam and the plasma jet. The ion beam and plasma jet are used for material processing. In order to investigate the effect of the ion beam and plasma jet, crystalline silicon substrates are placed above the anode. Samples obtained after irradiation with the plasma focus discharge are analyzed by using the Scanning electron microscopy (SEM) and Energy Dispersive X-ray spectroscopy (EDX).
- OSTI ID:
- 21344277
- Journal Information:
- AIP Conference Proceedings, Vol. 1150, Issue 1; Conference: 3. international meeting on frontiers in physics, Kuala Lumpur (Malaysia), 12-16 Jan 2009; Other Information: DOI: 10.1063/1.3192291; (c) 2009 American Institute of Physics; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ARGON IONS
ELECTRIC DISCHARGES
ELECTRON BEAMS
ION BEAMS
ION EMISSION
IRRADIATION
PLASMA
PLASMA FOCUS
PLASMA FOCUS DEVICES
PLASMA JETS
PLASMA PRESSURE
SCANNING ELECTRON MICROSCOPY
SILICON
THIN FILMS
X-RAY SPECTROSCOPY
BEAMS
CHARGED PARTICLES
ELECTRON MICROSCOPY
ELEMENTS
EMISSION
FILMS
IONS
LEPTON BEAMS
MICROSCOPY
OPEN PLASMA DEVICES
PARTICLE BEAMS
SEMIMETALS
SPECTROSCOPY
THERMONUCLEAR DEVICES