X-Pinch And Its Applications In X-ray Radiograph

Journal Article · Tue Jul 07 00:00:00 EDT 2009 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3192232· OSTI ID:21344249

Xiaobing, Zou; Xinxin, Wang; Rui, Liu; Tong, Zhao; Naigong, Zeng; Yongchao, Zhao; Yanqiang, Du ^[1]

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1. Department of Electrical Engineering, Tsinghua University, Beijing 100084 (China)

An X-pinch device and the related diagnostics of x-ray emission from X-pinch were briefly described. The time-resolved x-ray measurements with photoconducting diodes show that the x-ray pulse usually consists of two subnanosecond peaks with a time interval of about 0.5 ns. Being consistent with these two peaks of the x-ray pulse, two point x-ray sources of size ranging from 100 mum to 5 mum and depending on cut-off x-ray photon energy were usually observed on the pinhole pictures. The x-pinch was used as x-ray source for backlighting of the electrical explosion of single wire and the evolution of X-pinch, and for phase-contrast imaging of soft biological objects such as a small shrimp and a mosquito.

• OSTI ID: 21344249
• Journal Information: AIP Conference Proceedings, Vol. 1150, Issue 1; Conference: 3. international meeting on frontiers in physics, Kuala Lumpur (Malaysia), 12-16 Jan 2009; Other Information: DOI: 10.1063/1.3192232; (c) 2009 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
07 ISOTOPES AND RADIATION SOURCES
EXPLODING WIRES
IMAGES
PINCH DEVICES
PINCH EFFECT
PLASMA
PLASMA DIAGNOSTICS
PULSES
TIME RESOLUTION
X-RAY RADIOGRAPHY
X-RAY SOURCES
X-RAY SPECTRA
INDUSTRIAL RADIOGRAPHY
MATERIALS TESTING
NONDESTRUCTIVE TESTING
RADIATION SOURCES
RESOLUTION
SPECTRA
TESTING
THERMONUCLEAR DEVICES
TIMING PROPERTIES
WIRES