Characterization of Ti{sub 1-x}Al{sub x}N coatings with selective IR reflectivity
- Instituto de Ciencia de Materiales de Sevilla CSIC-US, Av. Americo Vespucio 49, 41092 Sevilla (Spain)
- Institute of Spectroscopy of Russian Academy of Sciences, 142190 Troitsk, Moscow Reg. (Russian Federation)
Ti{sub 1-x}Al{sub x}N thin films were deposited by reactive magnetron sputtering. The obtained different stoichiometries give rise to different optical properties as the films change from metallic to dielectric. In this work the IR reflectivity of these coatings is investigated taking into account different application fields for IR selective Ti{sub 1-x}Al{sub x}N thin films. Low Al content coatings present high reflectivity, high absorptance and low thermal emittance. High Al compositions give raise to coatings with high absorptance and high thermal emittance. The composition of the coatings was evaluated combining electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy. Scanning electron microscopy (SEM) revealed a columnar structure. Reflectance spectra for the visible and infrared spectral ranges were used to obtain the solar absorptance and thermal emittance values, used to calculate the equilibrium temperature of the coatings. The thermal stability in air from 300 to 600 C was also evaluated. (author)
- OSTI ID:
- 21337882
- Journal Information:
- Solar Energy, Vol. 84, Issue 8; Other Information: Elsevier Ltd. All rights reserved; ISSN 0038-092X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
REFLECTIVITY
SCANNING ELECTRON MICROSCOPY
ENERGY-LOSS SPECTROSCOPY
THIN FILMS
REFLECTIVE COATINGS
SOLAR ABSORBERS
AIR
DIELECTRIC MATERIALS
SPUTTERING
EQUILIBRIUM
VISIBLE SPECTRA
STABILITY
STOICHIOMETRY
TITANIUM NITRIDES
ALUMINIUM NITRIDES
ABSORPTIVITY
EMISSISIVITY
SPECTRALLY SELECTIVE SURFACES
INFRARED SPECTRA
Selective IR
Magnetron sputtering
Space applications