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Title: Characterization of Ti{sub 1-x}Al{sub x}N coatings with selective IR reflectivity

Journal Article · · Solar Energy
 [1]; ; ;  [1]; ; ;  [2]
  1. Instituto de Ciencia de Materiales de Sevilla CSIC-US, Av. Americo Vespucio 49, 41092 Sevilla (Spain)
  2. Institute of Spectroscopy of Russian Academy of Sciences, 142190 Troitsk, Moscow Reg. (Russian Federation)

Ti{sub 1-x}Al{sub x}N thin films were deposited by reactive magnetron sputtering. The obtained different stoichiometries give rise to different optical properties as the films change from metallic to dielectric. In this work the IR reflectivity of these coatings is investigated taking into account different application fields for IR selective Ti{sub 1-x}Al{sub x}N thin films. Low Al content coatings present high reflectivity, high absorptance and low thermal emittance. High Al compositions give raise to coatings with high absorptance and high thermal emittance. The composition of the coatings was evaluated combining electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy. Scanning electron microscopy (SEM) revealed a columnar structure. Reflectance spectra for the visible and infrared spectral ranges were used to obtain the solar absorptance and thermal emittance values, used to calculate the equilibrium temperature of the coatings. The thermal stability in air from 300 to 600 C was also evaluated. (author)

OSTI ID:
21337882
Journal Information:
Solar Energy, Vol. 84, Issue 8; Other Information: Elsevier Ltd. All rights reserved; ISSN 0038-092X
Country of Publication:
United States
Language:
English