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Title: Effect of multipactor conditioning on technical electrode surfaces

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3273741· OSTI ID:21335718
; ;  [1]
  1. Aerospace Corporation, El Segundo, CA (United States)

Historically, multipactor conditioning has been utilized to remove surface contaminants from rf electrodes by electron-stimulated gas desorption, and such conditioning has been shown to reduce multipactor susceptibility. Multipactor threshold improvements are due to increasing E{sub 1}, the minimum energy for the secondary electron coefficient, {delta}>1, such that resonant electrons are incapable of producing discharge-sustaining secondary emission. Using an rf amplitude sweep technique, the evolution of the multipactor threshold is measured as a function of multipactor conditioning time for a series of technical electrode surfaces. Results show over +3 dB of threshold improvement in copper and gold electrodes, while the aluminum threshold actually decreases with conditioning exposure. Additionally, these conditioning results indicate the possible voltage region for transient-mode multipaction (TMM), which can cause significant risk to rf systems such as space satellite components for which in-situ conditioning is generally not possible. Experimental results and supporting Monte Carlo particle tracking simulation results are presented.

OSTI ID:
21335718
Journal Information:
AIP Conference Proceedings, Vol. 1187, Issue 1; Conference: 18. topical conference on radio frequency power in plasmas, Gent (Belgium), 24-26 Jun 2009; Other Information: DOI: 10.1063/1.3273741; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English