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High-resolution x-ray spectroscopy with the EBIT Calorimeter Spectrometer

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3292376· OSTI ID:21325812
; ; ;  [1]; ; ; ;  [2];  [3]
  1. NASA Goddard Space Flight Center, Greenbelt, MD 20771 (United States)
  2. Lawrence Livermore National Laboratory, Livermore, CA 94550 (United States)
  3. Stanford University, Stanford, CA 94305 (United States)
The EBIT Calorimeter Spectrometer (ECS) is a production-class 36 pixel x-ray calorimeter spectrometer that has been continuously operating at the Electron Beam Ion Trap (EBIT) facility at Lawrence Livermore National Laboratory for almost 2 years. The ECS was designed to be a long-lifetime, turn-key spectrometer that couples high performance with ease of operation and minimal operator intervention. To this end, a variant of the Suzaku/XRS spaceflight detector system has been coupled to a low-maintenance cryogenic system consisting of a long-lifetime liquid He cryostat, and a closed cycle, {sup 3}He pre-cooled adiabatic demagnetization refrigerator. The ECS operates for almost 3 weeks between cryogenic servicing and the ADR operates at 0.05 K for more than 60 hours between automatic recycles under software control. Half of the ECS semiconductor detector array is populated with mid-band pixels that have a resolution of 4.5 eV FWHM, a bandpass from 0.05-12 keV, and a quantum efficiency of 95% at 6 keV. The other half of the array has thick HgTe absorbers that have a bandpass from 0.3 to over 100 keV, an energy resolution of 33 eV FWHM, and a quantum efficiency of 32% at 60 keV. In addition, the ECS uses a real-time, autonomous, data collection and analysis system developed for the Suzaku/XRS instrument and implemented in off-the-shelf hardware for the ECS. Here we will discuss the performance of the ECS instrument and its implementation as a turnkey cryogenic detector system.
OSTI ID:
21325812
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1185; ISSN 0094-243X; ISSN APCPCS
Country of Publication:
United States
Language:
English