Noninvasive electron microscopy with interaction-free quantum measurements
Journal Article
·
· Physical Review. A
- Department of Electrical Engineering and Computer Science and Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139 (United States)
We propose the use of interaction-free quantum measurements with electrons to eliminate sample damage in electron microscopy. This might allow noninvasive molecular-resolution imaging. We show the possibility of such measurements in the presence of experimentally measured quantum decoherence rates and using a scheme based on existing charged particle trapping techniques.
- OSTI ID:
- 21316322
- Journal Information:
- Physical Review. A, Vol. 80, Issue 4; Other Information: DOI: 10.1103/PhysRevA.80.040902; (c) 2009 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1050-2947
- Country of Publication:
- United States
- Language:
- English
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