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Title: Hole and electron traps in the YAlO{sub 3} single crystal scintillator

Journal Article · · Physical Review. B, Condensed Matter and Materials Physics
; ;  [1];  [2];  [1];  [3]
  1. Institute of Physics, Academy of Sciences of the Czech Republic, 10 Cukrovarnicka Street, 16253 Prague 6 (Czech Republic)
  2. Department of Materials Science, University of Milano-Bicocca, via Cozzi 53, 20125 Milan (Italy)
  3. CRYTUR Ltd., Palackeho 175, 511 19 Turnov (Czech Republic)

The processes of hole and electron localization in YAlO{sub 3} single crystals were investigated by electron-spin resonance. It was found that holes created by UV or x-ray irradiation are trapped at regular oxygen ions forming two types of O{sup -} hole centers corresponding to hole localization at two inequivalent oxygen ions which are located in Y and Al planes, respectively. The hole can be either autolocalized or additionally stabilized by a defect in the neighborhood of the oxygen ion such as yttrium vacancy or an impurity ion at Y site. This leads to a variety of O{sup -} centers which differ both by thermal stability (from about 14 K up to room temperature) and spectral parameters. Electron-type trapping sites are assigned to Y{sub Al} antisite ions. After trapping an electron they become paramagnetic Y{sub Al}{sup 2+} centers. They are found in several configurations with thermal stability up to above 300 K that enables the radiative recombination of freed holes with such localized electrons and the appearance of thermoluminescence peaks. It is shown that the electron trapped around Y{sub Al} antisite ion is additionally stabilized either by an oxygen vacancy or by a defect at Y site. The yttrium antisite ions in the lattice were directly identified by {sup 89}Y nuclear magnetic resonance.

OSTI ID:
21294229
Journal Information:
Physical Review. B, Condensed Matter and Materials Physics, Vol. 80, Issue 4; Other Information: DOI: 10.1103/PhysRevB.80.045114; (c) 2009 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 1098-0121
Country of Publication:
United States
Language:
English