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Title: Imaging photoelectron photoion coincidence spectroscopy with velocity focusing electron optics

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.3082016· OSTI ID:21266777
; ;  [1];  [2];  [3];  [4]
  1. Paul Scherrer Institut, Villigen 5232 (Switzerland)
  2. Institute of Chemistry, Eoetvoes Lorand University, Budapest 1117 (Hungary)
  3. Department of Chemistry, University of the Pacific, Stockton, California 95211 (United States)
  4. Department of Chemistry, University of North Carolina, Chapel Hill, North Carolina 27599 (United States)

An imaging photoelectron photoion coincidence spectrometer at the vacuum ultraviolet (VUV) beamline of the Swiss Light Source is presented and a few initial measurements are reported. Monochromatic synchrotron VUV radiation ionizes the cooled or thermal gas-phase sample. Photoelectrons are velocity focused, with better than 1 meV resolution for threshold electrons, and also act as start signal for the ion time-of-flight analysis. The ions are accelerated in a relatively low, 40-80 V cm{sup -1} field, which enables the direct measurement of rate constants in the 10{sup 3}-10{sup 7} s{sup -1} range. All electron and ion events are recorded in a triggerless multiple-start/multiple-stop setup, which makes it possible to carry out coincidence experiments at >100 kHz event frequencies. As examples, the threshold photoelectron spectrum of the argon dimer and the breakdown diagrams for hydrogen atom loss in room temperature methane and the chlorine atom loss in cold chlorobenzene are shown and discussed.

OSTI ID:
21266777
Journal Information:
Review of Scientific Instruments, Vol. 80, Issue 3; Other Information: DOI: 10.1063/1.3082016; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English