WIDEBAND ULTRASONIC TIME OF FLIGHT DIFFRACTION COMBINING B-SCANS AND CROSS-SECTIONAL IMAGING

Journal Article · Tue Mar 03 00:00:00 EST 2009 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3114317· OSTI ID:21260291

Petcher, P A; Dixon, S ^[1]

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1. Ultrasonics Group, Department of Physics, University of Warwick, Coventry, CV4 7AL (United Kingdom)

Time of Flight Diffraction and Imaging (ToFDI) is a new technique utilizing a sparse array of transducers and signal processing to improve B-Scan output and create a cross-sectional image of a sample. This paper describes preliminary work demonstrating the concept, including; Finite Element Modelling (FEM), basic processing, likely applications. The eventual aim is for fast and automated detection, identification, positioning and sizing for all defects in a sample with known basic characteristics, such as bulk and shear elastic moduli.

• OSTI ID: 21260291
• Journal Information: AIP Conference Proceedings, Vol. 1096, Issue 1; Conference: 35. annual review of progress in quantitative nondestructive evaluation, Chicago, IL (United States), 20-25 Jul 2008; Other Information: DOI: 10.1063/1.3114317; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CROSS SECTIONS
DEFECTS
DETECTION
DIFFRACTION
FINITE ELEMENT METHOD
IMAGES
MASS SPECTRA
POSITIONING
SIGNALS
SIMULATION
TIME-OF-FLIGHT METHOD
TRANSDUCERS
ULTRASONIC TESTING