An Efficient Referencing And Sample Positioning System To Investigate Heterogeneous Substances With Combined Microfocused Synchrotron X-ray Techniques

Journal Article · Thu Jan 29 00:00:00 EST 2009 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3086243· OSTI ID:21260239

Spangenberg, Thomas; Goettlicher, Joerg; Steininger, Ralph ^[1]

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1. Forschimgszentrum Karlsruhe GmbH, Institute for Synchrotron Radiation, Synchrotron Radiation Source ANKA, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen (Germany)

A referencing and sample positioning system has been developed to transfer object positions measured with an offline microscope to a synchrotron experimental station. The accuracy should be sufficient to deal with heterogeneous samples on micrometer scale. Together with an online fluorescence mapping visualisation the optical alignment helps to optimize measuring procedures for combined microfocused X-ray techniques.

• OSTI ID: 21260239
• Journal Information: AIP Conference Proceedings, Vol. 1092, Issue 1; Conference: 6. international conference on synchrotron radiation in materials science, Campinas (Brazil), 20-23 Jul 2008; Other Information: DOI: 10.1063/1.3086243; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

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ACCURACY
ALIGNMENT
FLUORESCENCE
MICROSCOPES
NANOSTRUCTURES
POSITIONING
SYNCHROTRON RADIATION
SYNCHROTRONS
TOPOGRAPHY
X RADIATION