Applications of synchrotron-based micro-imaging techniques for the analysis of Cultural Heritage materials
- Center of Research and Restoration of the French Museums, Palais du Louvre, Porte des Lions, 14 quai F. Mitterrand 75001 Paris (France)
- Private curator, Barcelona (Spain)
- JCICC-NRICP, Tokyo, 13-43, Ueno koen, Tokyo, 110-8713 (Japan)
- European Synchrotron Radiation Facilit, BP220, 38043 Grenoble Cedex (France)
The analysis of cultural Heritage objects is often technically challenging. When analyzing micro-fragments, the amount of matter is usually very tiny, hence requiring sensitive techniques. These samples, in particular painting fragments, may present multi-layered structures, with layer thickness of {approx}10 {mu}m. It leads to favor micro-imaging techniques, with a good lateral resolution (about one micrometer), that manage the discriminative study of each layer. Besides, samples are usually very complex in term of chemistry, as they are made of mineral and organic matters, amorphous and crystallized phases, major and minor elements. Accordingly, a multi-modal approach is generally essential to solve the chemical complexity of such hybrid materials. Different examples will be given, to illustrate the various possibilities of synchrotron-based micro-imaging techniques, such as micro X-ray diffraction, micro X-ray fluorescence, micro X-ray absorption spectroscopy and micro FTIR spectroscopy. Focus will be made on paintings, but the whole range of museum objects (going from soft matter like paper or wood to hard matter like metal and glass) will be also considered.
- OSTI ID:
- 21260228
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1092; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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