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Title: Electron inertia effects in 2D driven reconnection in electron MHD

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3033726· OSTI ID:21251759
 [1];  [2];  [3]
  1. Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino (Italy)
  2. Oak Ridge National Laboratory, Oak Ridge TN 37831 (United States)
  3. Los Alamos National Laboratory, Los Alamos NM 87545 (United States)

We propose a zero-dimensional dynamical model which describes the effects of electron inertia in electron MHD (EMHD) reconnection with resistive and viscous dissipation. Steady-state properties of the reconnection region are examined. In the resistivity-dominated regime, we find that the current sheet thickness is limited to the inertial length scale and no thinner structures can develop. Reconnection is slow and outflows are Alfvenic. A linear stability analysis suggests that elongated diffusion regions may be preferable. On the other hand, in the viscosity-dominated regime, we find that linearly stable viscous layers, thinner than the electron inertial scale length, can develop to sustain reconnection. In this regime, the maximum reconnection rate is formally independent of dissipation and therefore potentially fast.

OSTI ID:
21251759
Journal Information:
AIP Conference Proceedings, Vol. 1069, Issue 1; Conference: Joint Varenna-Lausanne international workshop on theory of fusion plasmas, Varenna (Italy), 25-29 Aug 2008; Other Information: DOI: 10.1063/1.3033726; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English