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Title: Improved measurement of the CKM angle {gamma} in B{sup {+-}}{yields}D{sup (*)}K{sup (*){+-}} decays with a Dalitz plot analysis of D decays to K{sub S}{sup 0}{pi}{sup +}{pi}{sup -} and K{sub S}{sup 0}K{sup +}K{sup -}

Journal Article · · Physical Review. D, Particles Fields
; ; ; ; ; ; ;  [1]; ;  [2]; ; ;  [3]; ; ;  [4]; ; ; ;  [5]
  1. Laboratoire de Physique des Particules, IN2P3/CNRS et Universite de Savoie, F-74941 Annecy-Le-Vieux (France)
  2. Universitat de Barcelona, Facultat de Fisica, Departament ECM, E-08028 Barcelona (Spain)
  3. Universita di Bari, Dipartimento di Fisica and INFN, I-70126 Bari (Italy)
  4. University of Bergen, Institute of Physics, N-5007 Bergen (Norway)
  5. Lawrence Berkeley National Laboratory and University of California, Berkeley, California 94720 (United States)

We report on an improved measurement of the Cabibbo-Kobayashi-Maskawa CP-violating phase {gamma} through a Dalitz plot analysis of neutral D meson decays to K{sub S}{sup 0}{pi}{sup +}{pi}{sup -} and K{sub S}{sup 0}K{sup +}K{sup -} produced in the processes B{sup {+-}}{yields}DK{sup {+-}}, B{sup {+-}}{yields}D*K{sup {+-}} with D*{yields}D{pi}{sup 0}, D{gamma}, and B{sup {+-}}{yields}DK*{sup {+-}} with K*{sup {+-}}{yields}K{sub S}{sup 0}{pi}{sup {+-}}. Using a sample of 383x10{sup 6} BB pairs collected by the BABAR detector, we measure {gamma}=(76{+-}22{+-}5{+-}5) deg. (mod 180 deg.), where the first error is statistical, the second is the experimental systematic uncertainty, and the third reflects the uncertainty on the description of the Dalitz plot distributions. The corresponding 2-standard-deviation region is 29 deg. <{gamma}<122 deg. This result has a significance of direct CP violation ({gamma}{ne}0) of 3.0 standard deviations.

OSTI ID:
21250627
Journal Information:
Physical Review. D, Particles Fields, Vol. 78, Issue 3; Other Information: DOI: 10.1103/PhysRevD.78.034023; (c) 2008 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0556-2821
Country of Publication:
United States
Language:
English